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Acetone Testing Decapsulation Dynasolve 750 Testing External Visual Inspection Hermeticity Testing HTT Mark Permanency Methyl/Pyrrolidone Testing Surface Texture Analysis XRF X-Ray Analysis

AC&DC Parametric Tests DDR Memory Testing Electrical Testing Electrical Testing - ADC/DAC Electrical Testing -Analog Electrical Testing -ASIC Electrical Testing -Digital Electrical Testing -FPGA Electrical Testing -Hi Speed Transceivers Electrical Testing -Microprocessors Electrical Testing -Mixed Signal Electrical Testing -RF Components ( Replace RF Component testing ) Extended MLCC Testing Services JTAG and Boundary Scan Memory Testing/Programming Service RF Component Testing Transistor/Mosfet Testing

Environmental Testing Environmental Testing - High and Low Temperature Operating Limits(HTOL/LTOL) Environmental Testing - High Temperature Storage Life (HTSL) Environmental Testing - Highly Accelerated Stress Test (HAST) Environmental Testing - Temperature Humidity Bias (THB)

ESD -Electronic Static Discharge test - CDM ESD -Electronic Static Discharge test - HBM ESD -Electronic Static Discharge test - IEC ESD -Electronic Static Discharge test - MM

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ESD/Latch-up Testing Latch-up Test - CDM Latch-up Test - HBM Latch-up Test - IEC Latch-up Test - MM

Raman Spectroscopy Testing Services SEM & EDS Testing Services XRF

Mil Std Testing Mil Std Testing - D4727 Mil Std Testing - D4727M Mil Std Testing - D5118M Mil Std Testing - JEDEC Mil Std Testing - MIL-STD-3010 Method 3005 Mil Std Testing - NASA Standards Mil Std Testing - Supplier Quality Notes Mil Std Testing -MIL STD 202 Mil Std Testing -MIL STD 750 Mil Std Testing -MIL STD 883 MIL-STD-1580 Destructive Physical Analysis

Acoustic Microscopy Testing Autoclave Testing Ball / Die Shear Testing Device Characterization testing EFR Analysis Testing Fine/Gross Leak — Kr85 Testing Mechanical Shock Testing Other Level III & Sub System Testing Particle Impact Noise Detection (PIND) Testing Salt Atmosphere Testing Shadow Moiré/Warpage Analysis Testing Temperature/Power Cycle Operating Life Testing Thermal Shock Testing Vibration Testing

PEM (Plastic Encapsulated Microcircuit) Qualification PEM (Plastic Encapsulated Microcircuit) Qualification - EEE-INST-002 PEM (Plastic Encapsulated Microcircuit) Qualification - MIL-STD-202 PEM (Plastic Encapsulated Microcircuit) Qualification - MIL-STD-750 PEM (Plastic Encapsulated Microcircuit) Qualification - MIL-STD-883

MIL-STD Radiation Effects Test MIL-STD Radiation Effects Test - ASTM F1892. MIL-STD Radiation Effects Test - Determine the effects of gammaradiation on microelectronics MIL-STD Radiation Effects Test - Determine the effects of gammaradiation on photonics components and systems. MIL-STD Radiation Effects Test - Device Testing per MIL-STD-750 MIL-STD Radiation Effects Test - ELDRS (Enhanced Low Dose RadiationSensitivity) MIL-STD Radiation Effects Test - Method 1019 MIL-STD Radiation Effects Test - MIL-STD-883 MIL-STD Radiation Effects Test - RLAT (Radiation Lot AcceptanceTesting ) MIL-STD Radiation Effects Test - Total Ionizing Dose (TID) Radiation Effects Testing - SEB (Single Event Burnout)s Radiation Effects Testing - SEGR (ASTM F1192) Radiation Effects Testing - SEGR (EIA/JESD 57) Radiation Effects…

Reliability Testing Reliability Testing - Accelerated Evaluation & Qualification Reliability Testing - Advanced Chamberless Burn-in (RF device testing) Reliability Testing - Board-level Solder Joint Reliability Reliability Testing - Device characterization / Feasibility Analysis Reliability Testing - High-powered, liquid and RF burn-in Reliability Testing - High-reliability Qualification Reliability Testing - Mechanical Testing Reliability Testing - Multiple package/product evaluation

Wetting Balance Testing Services

Accelerated Life testing HTOL ( High Temperature Operation Life testing) LTOL ( Low Temperature Operation Life testing)

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